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2 May 1994 Index profile reconstruction of Ti:LiNbO3 structures and bending loss evaluation from near-field measurements
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Abstract
Index profiles of Ti:LiNbO3 waveguides can efficiently be reconstructed by measuring the near-field patterns for different waveguide widths. By this, bending losses of curved waveguides can accurately be predicted. The validity of this method is verified by comparing calculated bending losses with those measured for fabricated semicircular waveguides of different bending radii.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert F. Tavlykaev, Karin Kueckelhaus, and Edgar I. Voges "Index profile reconstruction of Ti:LiNbO3 structures and bending loss evaluation from near-field measurements", Proc. SPIE 2150, Design, Simulation, and Fabrication of Optoelectronic Devices and Circuits, (2 May 1994); https://doi.org/10.1117/12.174997
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