Paper
1 April 1994 Epitaxial diamond Schottky diode on p+-substrate
Wolfgang Ebert, A. Vescan, Thomas H. Borst, E. Olaf Weis, Erhard Kohn
Author Affiliations +
Proceedings Volume 2151, Diamond-Film Semiconductors; (1994) https://doi.org/10.1117/12.171753
Event: OE/LASE '94, 1994, Los Angeles, CA, United States
Abstract
Schottky diodes have been fabricated on homeoepitaxial p-doped diamond layers grown on p+-diamond substrates. Two distinctly different configurations were investigated to study the influence of the p+-substrate conductivity and obtain a rectifying characteristic with low ohmic loss. A series resistance of 8(Omega) was obtained at 500 degree(s)C for strong forward bias and a 5 X 10-5 cm2 contact area. Due to the low activation energy of the p+-substrate conductivity the minimum series resistance at R.T was 70(Omega) . To our knowledge, these are the lowest series resistances reported so far for a diamond Schottky diode enabling extremely high current densities of 103 A/cm2 in combination with a current rectification ratio of 105 at +/- 2V.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wolfgang Ebert, A. Vescan, Thomas H. Borst, E. Olaf Weis, and Erhard Kohn "Epitaxial diamond Schottky diode on p+-substrate", Proc. SPIE 2151, Diamond-Film Semiconductors, (1 April 1994); https://doi.org/10.1117/12.171753
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KEYWORDS
Diodes

Resistance

Diamond

Doping

Semiconductors

Temperature metrology

Gold

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