Origin of the Tc-depression in ultrathin YBCO

M. Z. Cieplak; S. Guha; S. Vadlamannati; C. H. Nien; Peter Lindenfeld

doi:10.1117/12.179146

29 June 1994 Origin of the T_c-depression in ultrathin YBCO

M. Z. Cieplak, S. Guha, S. Vadlamannati, C. H. Nien, Peter Lindenfeld

Proceedings Volume 2157, Superconducting Superlattices and Multilayers; (1994) https://doi.org/10.1117/12.179146
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

Conductance measurements on YBa₂Cu₃O_7-(delta ) (YBCO) between layers of Y_1-xPr_xBa₂Cu₃O_{7- (delta} ) [(Y-Pr)BCO] show a transition from a bulk regime in the interior of the YBCO to a surface regime near the interfaces. The depression of the zero-resistance transition temperature in ultrathin YBCO is correlated with the depressed conductance in the surface layer. The results indicate that the changes are related to the presence of the interfaces, primarily to charge transfer between the layers, with little, it any, indication of a change in the intrinsic properties of the YBCO from bulk down to the thickness of a single unit cell.

Citation Download Citation

M. Z. Cieplak, S. Guha, S. Vadlamannati, C. H. Nien, and Peter Lindenfeld "Origin of the T_c-depression in ultrathin YBCO", Proc. SPIE 2157, Superconducting Superlattices and Multilayers, (29 June 1994); https://doi.org/10.1117/12.179146

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