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2 July 1994 Correlation of current-voltage characteristics of step-edge YBa2Cu3O7 Josephson junctions with the step angle
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Proceedings Volume 2160, Superconductive Devices and Circuits; (1994)
Event: OE/LASE '94, 1994, Los Angeles, CA, United States
We report on a systematic study of the transport characteristics of YBa2Cu3O7 (YBCO) step-edge Josephson junctions as a function of the step angle. The microstructure of a YBCO film depends very critically on the step angle (alpha) in a SrTiO3 or LaAlO3 substrate. Briefly, on shallow steps (0 < (alpha) < 44 degree(s)) the film grows epitaxially across the step. On steep steps (46 degree(s) < (alpha) < 85 degree(s)) two grain boundaries occur on the step. In this paper it is shown that the I-V curves of the step-edge junction reflect the microstructure of the YBCO film on the step. The I-V curves on shallow steps are of flux-flow type. On 45 degree(s) steps there are several Josephson junctions with different critical currents, while on steep steps two critical currents are found in the I-V curve. Summarizing all data, we conclude that the grain boundaries formed on steep steps are responsible for the Josephson behaviour of the junctions.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. Herrmann, Michael Siegel, Gerhard Kunkel, A. Thust, B. Kabius, C. L. Jia, Juergen Schubert, and Alex I. Braginski "Correlation of current-voltage characteristics of step-edge YBa2Cu3O7 Josephson junctions with the step angle", Proc. SPIE 2160, Superconductive Devices and Circuits, (2 July 1994);


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