Paper
1 May 1994 Fluoroscopic x-ray imaging with amorphous silicon thin-film arrays
Ulrich W. Schiebel, Norbert Conrads, Norbert Jung, Martin Weibrecht, Herfried K. Wieczorek, Thomas T. Zaengel, M. J. Powell, I. D. French, C. Glasse
Author Affiliations +
Abstract
The dream of an all-solid state large area x-ray image sensor with digital readout and full dynamic performance will most probably find a first realization in 2D thin-film amorphous silicon arrays. In this paper we address in particular the evaluation of the limits of the signal/noise ratio in this concept. Using small prototype detectors measurements of MTF and noise power spectra have been made as a function of x-ray dose. The results are given in terms of the detective quantum efficiency as a function of dose and spatial frequency. We further present an analysis of the different noise sources and their dependence on the detector parameters, and we provide estimates on the maximum signals that may be achieved per unit dose. The intrinsic lag of the amorphous silicon photodiodes causes a second problem area with this type of x-ray detectors. Especially in radiography/fluoroscopy mixed applications, memory effects may not be negligible.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ulrich W. Schiebel, Norbert Conrads, Norbert Jung, Martin Weibrecht, Herfried K. Wieczorek, Thomas T. Zaengel, M. J. Powell, I. D. French, and C. Glasse "Fluoroscopic x-ray imaging with amorphous silicon thin-film arrays", Proc. SPIE 2163, Medical Imaging 1994: Physics of Medical Imaging, (1 May 1994); https://doi.org/10.1117/12.174248
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Cited by 59 scholarly publications.
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KEYWORDS
Sensors

Photodiodes

Spatial frequencies

Electrons

Amorphous silicon

Medical imaging

Reflectors

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