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11 March 1994 Chromato-structural approach toward surface defect detection in random textured images
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Proceedings Volume 2183, Machine Vision Applications in Industrial Inspection II; (1994) https://doi.org/10.1117/12.171208
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States
Abstract
Machine vision and automatic surface inspection has been an active field of research during the last few years. However, very little research has been contributed to the area of defect detection in textured images, especially for the case of random textures. In this paper, we propose a novel algorithm that uses color and texture information to solve the problem. A new color clustering scheme based on human color perception is developed. No a priori knowledge regarding the actual number of colors associated with the color image is required. With this algorithm, very promising results are obtained on defect detection in random textured images and in particular, granite images.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. Y. Song, Josef Kittler, Maria Petrou, and I. Ng "Chromato-structural approach toward surface defect detection in random textured images", Proc. SPIE 2183, Machine Vision Applications in Industrial Inspection II, (11 March 1994); https://doi.org/10.1117/12.171208
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