Phase-strain model for polarimetric strain sensors based on fictitious residual strains

Yu-Lung Lo; Peter Louring Nielsen; James S. Sirkis

doi:10.1117/12.173978

1 May 1994 Phase-strain model for polarimetric strain sensors based on fictitious residual strains

Yu-Lung Lo, Peter Louring Nielsen, James S. Sirkis

Proceedings Volume 2191, Smart Structures and Materials 1994: Smart Sensing, Processing, and Instrumentation; (1994) https://doi.org/10.1117/12.173978
Event: 1994 North American Conference on Smart Structures and Materials, 1994, Orlando, FL, United States

Abstract

The development of a phenomenologically based phase-strain model for structurally embedded polarimetric sensors is presented and then applied to Bow-Tie and e-core high-birefringence optical fibers and a standard circular core low-birefringence optical fiber. This phase-strain model is developed by postulating the existence of a fictitious residual strain state in the optical fiber core, and then following standard model development techniques. Calibration procedures are used to determine all parameters required by this model.

Citation Download Citation

Yu-Lung Lo, Peter Louring Nielsen, and James S. Sirkis "Phase-strain model for polarimetric strain sensors based on fictitious residual strains", Proc. SPIE 2191, Smart Structures and Materials 1994: Smart Sensing, Processing, and Instrumentation, (1 May 1994); https://doi.org/10.1117/12.173978

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