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23 June 1995 Effects of absorption and coupling strength on accuracy of dark mode refractometry
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Proceedings Volume 2208, Refractometry; (1995) https://doi.org/10.1117/12.213177
Event: Refractometry: International Conference, 1994, Warsaw, Poland
Abstract
The study of guided waves in a thin layer allows a precise characterization of refractive index and thickness. In our experimental equipment the propagation constants of guided modes were measured by the dark mode spectroscopy technique. Series of dark lines known as the m-lines were observed on the screen. Angles synchronous to the propagating modes were calculated from measurement of the angular distribution of the m-lines. The positions of the m-lines depends on thin film absorption and coupling strength.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jaromir Pistora and Dalibor Ciprian "Effects of absorption and coupling strength on accuracy of dark mode refractometry", Proc. SPIE 2208, Refractometry, (23 June 1995); https://doi.org/10.1117/12.213177
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