Statistical algorithm to obtain refractive index and thickness from spectrophotometric interference patterns

Fernando Carreno; Eusebio Bernabeu

doi:10.1117/12.213171

23 June 1995 Statistical algorithm to obtain refractive index and thickness from spectrophotometric interference patterns

Fernando Carreno, Eusebio Bernabeu

Author Affiliations +

Proceedings Volume 2208, Refractometry; (1995) https://doi.org/10.1117/12.213171
Event: Refractometry: International Conference, 1994, Warsaw, Poland

Abstract

A statistically based scheme is proposed to analyze the interference pattern obtained by a spectrophotometric system in order to determine the refractive index and the thickness of the sample. The absolute interference order of the interference pattern is determined with the proposed technique. The major approximation inherent in the method is that the layer must be weakly absorbing and non-dispersive over the wavelength region of interest.

Citation Download Citation

Fernando Carreno and Eusebio Bernabeu "Statistical algorithm to obtain refractive index and thickness from spectrophotometric interference patterns", Proc. SPIE 2208, Refractometry, (23 June 1995); https://doi.org/10.1117/12.213171

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available