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25 August 1994 Photothermal optical losses characterization of channel waveguides
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Proceedings Volume 2212, Linear and Nonlinear Integrated Optics; (1994) https://doi.org/10.1117/12.185108
Event: Integrated Optoelectronics '94, 1994, Lindau, Germany
Abstract
The photodeflection method applied to the propagation losses characterization in channel waveguides is discussed using two different set-up configurations. 3D and 1D models are presented in order to calculate the photodeflection angle. The effects on the measurement of set-up misalignments are studied. Different ways for determining the propagation losses are shown. Comparison between theoretical and experimental results for Ti:LiNbO3 and a glass channel waveguide is also reported. The method has proven suitable to measure losses as low as 0.2 dB/cm.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mario Bertolotti, L. Fabbri, G. L. Liakhou, Roberto Li Voti, A. Matera, Concita Sibilia, and M. Valentino "Photothermal optical losses characterization of channel waveguides", Proc. SPIE 2212, Linear and Nonlinear Integrated Optics, (25 August 1994); https://doi.org/10.1117/12.185108
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