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15 June 1994 Dynamic infrared projection analysis: an overview
Owen M. Williams
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Proceedings Volume 2223, Characterization and Propagation of Sources and Backgrounds; (1994) https://doi.org/10.1117/12.177906
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States
Abstract
In recent years there have been rapid developments in the field of dynamic infrared scene projection, driven principally by the demands for real-time hardware-in-the-loop simulation and by the fortuitously concurrent advances in large array silicon surface micromachining techniques and addressing/multiplexing scheme electronics. A diversity of techniques have been explored towards satisfying the infrared projection requirements, resulting in a need for development of systematic comparative assessment procedures. In this paper the current status of infrared projector analysis is reviewed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Owen M. Williams "Dynamic infrared projection analysis: an overview", Proc. SPIE 2223, Characterization and Propagation of Sources and Backgrounds, (15 June 1994); https://doi.org/10.1117/12.177906
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