Understanding infrared clutter through fixation point analysis

Stanley R. Rotman; Marta L. Kowalczyk; Joan F. Cartier; J. Chang

doi:10.1117/12.177907

15 June 1994 Understanding infrared clutter through fixation point analysis

Stanley R. Rotman, Marta L. Kowalczyk, Joan F. Cartier, J. Chang

Proceedings Volume 2223, Characterization and Propagation of Sources and Backgrounds; (1994) https://doi.org/10.1117/12.177907
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

A model is proposed for determining the effect of image clutter on the time-line behavior of observer eye fixations when searching for targets in infrared scenery. Several possible metrics for qualitatively evaluating the degree of clutter are tested. Correlations between these metrics, the probability of fixating a particular area, and the length of time spent fixating a particular area are discussed.

Citation Download Citation

Stanley R. Rotman, Marta L. Kowalczyk, Joan F. Cartier, and J. Chang "Understanding infrared clutter through fixation point analysis", Proc. SPIE 2223, Characterization and Propagation of Sources and Backgrounds, (15 June 1994); https://doi.org/10.1117/12.177907

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