Proposed standard for infrared focal-plane array nonuniformity measurements

James A. Dawson; Eric J. Borg; Gill L. Duykers

doi:10.1117/12.180088

8 July 1994 Proposed standard for infrared focal plane array nonuniformity measurements

James A. Dawson, Eric J. Borg, Gill L. Duykers

Proceedings Volume 2224, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V; (1994) https://doi.org/10.1117/12.180088
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

The staring IR focal plane array (IRFPA), once a novelty, has now evolved into an important technology being used in a variety of imaging systems. These systems frequently include schemes for nonuniformity correction (NUC) that reduce artifacts caused by lack of detector uniformity within the IRFPA. The effect of these artifacts is a fixed pattern that interferes with the desired image of the scene. Although the resulting imagery can be substantially improved using NUC, significant residual fixed pattern noise (RFPN) typically remains. As IRFPAs become more standard in designs for missile seekers, measurement methods related to RFPN should be standardized. This paper introduces an improved method with which the IRFPA fixed pattern noise can be measured both before and after NUC algorithms have been applied. The proposed standard provides two key benefits: (1) consistent quantification of the specific characteristics of the inherent spatial noise or residual post-NUC RFPN that significantly impact system performance; and (2) a standardized process that facilitates IRFPA and NUC comparisons and measures progress toward design improvement. The approach considers the 3D noise modeling technique proposed for FLIR systems and modifies the technique to account for the spatial scale and power spectrum of the RFPN. The resulting characterization is called the simplified power spectrum (SPS). Residual low-frequency nonuniformities such as gradients across the entire array may not be as important as high-frequency, uncorrelated variations; the SPS allows differentiation of these RFPN effects. The algorithms and test procedures required for the standard are presented in the paper.

Citation Download Citation

James A. Dawson, Eric J. Borg, and Gill L. Duykers "Proposed standard for infrared focal plane array nonuniformity measurements", Proc. SPIE 2224, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V, (8 July 1994); https://doi.org/10.1117/12.180088

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available