High-performance long-wave infrared HgCdTe scanning focal plane arrays for surveillance applications

Samuel C. H. Wang; Gregg K. Dudoff; Steven R. Jost; John Roussis; Jeffrey Voelker; Michael L. Winn; T. J. Wyman

doi:10.1117/12.179710

Translator Disclaimer

15 July 1994 High-performance long-wave infrared HgCdTe scanning focal plane arrays for surveillance applications

Samuel C. H. Wang, Gregg K. Dudoff, Steven R. Jost, John Roussis, Jeffrey Voelker, Michael L. Winn, T. J. Wyman

Author Affiliations +

Proceedings Volume 2225, Infrared Detectors and Focal Plane Arrays III; (1994) https://doi.org/10.1117/12.179710
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

This paper describes an advanced scanning long wavelength IR focal plane array fabricated in HgCdTe. Comprised of an array of front-side illuminated, planar n-on-p homojunction diodes mated to a Si CMOS readout integration circuit, the array has a measured average spectral cutoff wavelength of 10.8 micrometers at 65 K with an average quantum efficiency of 87%. The FPA's peak D^* at temperatures of 65 and 78 K, in the absence of background radiation, exceeds 9.3 X 10¹¹ and 2.6 X 10¹¹ cm(root)Hz/W, respectively. No appreciable 1/f noise is evident even for reverse bias voltages as large as 50 mV. Both the spectral and the spatial responses of the diode are well-behaved; and the measured noise contribution due to background radiation agrees with theory.

Citation Download Citation

Samuel C. H. Wang, Gregg K. Dudoff, Steven R. Jost, John Roussis, Jeffrey Voelker, Michael L. Winn, and T. J. Wyman "High-performance long-wave infrared HgCdTe scanning focal plane arrays for surveillance applications", Proc. SPIE 2225, Infrared Detectors and Focal Plane Arrays III, (15 July 1994); https://doi.org/10.1117/12.179710

ACCESS THE FULL ARTICLE