Automatic in-line optical defect inspection system for aperture grilles

Andrew Chiu; Daniel Orband

doi:10.1117/12.169429

1 March 1994 Automatic in-line optical defect inspection system for aperture grilles

Andrew Chiu, Daniel Orband

Proceedings Volume 2237, Optical Pattern Recognition V; (1994) https://doi.org/10.1117/12.169429
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

This paper presents an automatic in-line optical defect inspection systems for aperture grilles used for Sony Trinitron related products. The requirement to detect defects as small as 50 micrometers X 150 micrometers in as large as 1000 mm X 800 mm aperture grilles imposes a severe limitation for conventional machine vision techniques.

Citation Download Citation

Andrew Chiu and Daniel Orband "Automatic in-line optical defect inspection system for aperture grilles", Proc. SPIE 2237, Optical Pattern Recognition V, (1 March 1994); https://doi.org/10.1117/12.169429

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