Measured characteristics of the reflected magneto-optic spatial light modulator (R-MOSLM TM) device

William E. Ross; James P. Karins; Theodore R. Maki; John R. Lucas; Louis G. Kelly Jr.; Niels Jacksen; Jaekyong Cho; David N. Lambeth; Tan Le; Keith Mountfield; Suresh Santhanam; Daniel D. Stancil; Mark H. Randles; Jonathan B. Whitlock; Dennis J. Garrity

doi:10.1117/12.179134

29 June 1994 Measured characteristics of the reflected magneto-optic spatial light modulator (R-MOSLM^TM) device

William E. Ross, James P. Karins, Theodore R. Maki, John R. Lucas, Louis G. Kelly Jr., Niels Jacksen, Jaekyong Cho, David N. Lambeth, Tan Le, Keith Mountfield, Suresh Santhanam, Daniel D. Stancil, Mark H. Randles, Jonathan B. Whitlock, Dennis J. Garrity

Author Affiliations +

Proceedings Volume 2240, Advances in Optical Information Processing VI; (1994) https://doi.org/10.1117/12.179134
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

This paper is a report on the characteristics of a new high resolution, high frame rate, reflected R-MOSLM. This effort is aimed at the production of Miniature Ruggedized Optical Correlators for Optical Pattern Recognition. Pixel size is under one mil center to center, one-third the dimension of present transmission mode devices, thereby reducing the optical path length by an order of magnitude. This development includes optimization of the optical and functional characteristics of the MOSLM for Mil Spec Systems.

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William E. Ross, James P. Karins, Theodore R. Maki, John R. Lucas, Louis G. Kelly Jr., Niels Jacksen, Jaekyong Cho, David N. Lambeth, Tan Le, Keith Mountfield, Suresh Santhanam, Daniel D. Stancil, Mark H. Randles, Jonathan B. Whitlock, and Dennis J. Garrity "Measured characteristics of the reflected magneto-optic spatial light modulator (R-MOSLM^TM) device", Proc. SPIE 2240, Advances in Optical Information Processing VI, (29 June 1994); https://doi.org/10.1117/12.179134

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