Intelligent image sensor for on-chip contour extraction

Juergen Schulte; Helmut Fischer; Markus Boehm

doi:10.1117/12.193940

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9 November 1994 Intelligent image sensor for on-chip contour extraction

Juergen Schulte, Helmut Fischer, Markus Boehm

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Proceedings Volume 2247, Sensors and Control for Automation; (1994) https://doi.org/10.1117/12.193940
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany

Abstract

Intelligent image sensors are becoming increasingly important in the field of production automation and artificial vision. Pixel detectors based on the TFA (thin film on ASIC)-concept represent a promising alternative to existing conventional sensor concepts. A TFA array is a vertically integrated device and consists of an unpatterned amorphous silicon (a-Si:H) photo detector on top of a crystalline ASIC. The entire area of a pixel is used for both, the thin film photo detector and analog or digital signal processing in local pixel processors. A-Si:H photo detectors such as Schottky-, pin- or nipin-diodes approximate the spectral response of the human eye much better than crystalline detectors. In this paper a prototype of a TFA sensor is presented. It consists of an array of 32 X 32 pixels and performs digital contour extraction. The performance of the sensor is evaluated and the influence of parasitic effects such as crosstalk between pixels and capacitive coupling inside the pixels are discussed. Both parasitic effects can be eliminated by technological as well as electronical means.

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Juergen Schulte, Helmut Fischer, and Markus Boehm "Intelligent image sensor for on-chip contour extraction", Proc. SPIE 2247, Sensors and Control for Automation, (9 November 1994); https://doi.org/10.1117/12.193940

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