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15 November 1994 Analysis of defects in ceramics through photothermal deflection method
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Proceedings Volume 2248, Optical Measurements and Sensors for the Process Industries; (1994) https://doi.org/10.1117/12.194330
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany
Abstract
A discussion about the photodeflection capability to detect layers and defects is presented. A 1D and 3D numerical analysis has been performed. In particular for the 3D case, a model based on the analog circuit method is applied to describe (surface or volume) defects and nonhomogeneities in materials, which can be detected through the photothermal deflection method. Experimental results are also discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mario Bertolotti, M. Firpo, Adriano Fontana, G. L. Liakhou, Roberto Li Voti, and Concita Sibilia "Analysis of defects in ceramics through photothermal deflection method", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); https://doi.org/10.1117/12.194330
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