Whole-field vibration phase measurement with electronic speckle pattern interferometry (ESPI)

Jesus D. R. Valera; Julian D. C. Jones; Angel F. Doval

doi:10.1117/12.194326

15 November 1994 Whole-field vibration phase measurement with electronic speckle pattern interferometry (ESPI)

Jesus D. R. Valera, Julian D. C. Jones, Angel F. Doval

Proceedings Volume 2248, Optical Measurements and Sensors for the Process Industries; (1994) https://doi.org/10.1117/12.194326
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany

Abstract

A stroboscopically illuminated ESPI system is described for the simultaneous measurement of vibration amplitude and phase. The technique involves modulating both the illumination pulse phase relative to the vibration, and the optical phase of the interferometer reference beam to generate eight video frames which are processed to yield vibration amplitude and phase.

Citation Download Citation

Jesus D. R. Valera, Julian D. C. Jones, and Angel F. Doval "Whole-field vibration phase measurement with electronic speckle pattern interferometry (ESPI)", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); https://doi.org/10.1117/12.194326

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