Paper
1 January 1994 BWO spectrometry of composite structures
R. Brazis
Author Affiliations +
Proceedings Volume 2250, International Conference on Millimeter and Submillimeter Waves and Applications 1994; 225039 (1994) https://doi.org/10.1117/12.2303134
Event: Millimeter and Submillimeter Waves and Applications: International Conference, 1994, San Diego, CA, United States
Abstract
Highly absorbing material parameters (water solutions, semiconducting solids etc) are shown to be determined with the use of tunable backward wave oscillator (BWO) spectrometry employing interface mode propagation.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Brazis "BWO spectrometry of composite structures", Proc. SPIE 2250, International Conference on Millimeter and Submillimeter Waves and Applications 1994, 225039 (1 January 1994); https://doi.org/10.1117/12.2303134
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KEYWORDS
Spectroscopy

Composites

Interfaces

Oscillators

Semiconductor physics

Semiconductors

Solids

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