Paper
4 November 1994 Computer-integrated manufacturing of advanced thin film coatings
Harry H. Bauer, Erwin Nuessler
Author Affiliations +
Proceedings Volume 2253, Optical Interference Coatings; (1994) https://doi.org/10.1117/12.192116
Event: 1994 International Symposium on Optical Interference Coatings, 1994, Grenoble, France
Abstract
We have implemented a process control system, based on in-situ spectral photometry, for the manufacturing of advanced optical coatings. The coating process parameters as well as the theoretical design values, like refractive indices and thicknesses, are stored in a database for documentation. Based on the high accuracy of the spectral optical thickness control, several examples for advanced coatings with enhanced optical performances are given.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Harry H. Bauer and Erwin Nuessler "Computer-integrated manufacturing of advanced thin film coatings", Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); https://doi.org/10.1117/12.192116
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Cited by 1 scholarly publication.
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KEYWORDS
Coating

Process control

Computer aided design

Databases

Optics manufacturing

Thin film coatings

Manufacturing

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