Paper
4 November 1994 Investigation of the microstructure of coatings for high-power lasers by nonoptical techniques
Robert J. Tench, Mark R. Kozlowski, Robert Chow
Author Affiliations +
Proceedings Volume 2253, Optical Interference Coatings; (1994) https://doi.org/10.1117/12.192138
Event: 1994 International Symposium on Optical Interference Coatings, 1994, Grenoble, France
Abstract
The microstructure of optical coatings strongly influence their resistance to high fluence laser, scatter properties, as well as their mechanical and environmental stability. The relative merits of nonoptical techniques such as scanning electron microscopy, transmission electron microscopy, atomic force microscopy, and focused ion beam are discussed as they apply to optical multilayer coatings. The combination of these techniques provides a unique method to analyze defects in coatings. the long-term objective of this work is to understand the initiation and growth mechanisms of defects in optical coatings, investigate failure mechanisms of laser coatings, and suggest methods for reducing the number of defects during the deposition process. \to date, our defect analysis using nonoptical techniques has focused on hafnia/silica multilayers for high-power lasers. In summary, the information we have compiled about the defect seeds indicates that (1) seed size has an influence upon the mechanical stability of the whole defect, (2) seed shape and chemical composition reveal potential seed sources in the coating systems, and (3) defects can be initiated either as a single event or continuously during the deposition process. Also, it is shown that different vendors have characteristic defects and seeds.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert J. Tench, Mark R. Kozlowski, and Robert Chow "Investigation of the microstructure of coatings for high-power lasers by nonoptical techniques", Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); https://doi.org/10.1117/12.192138
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Cited by 8 scholarly publications.
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KEYWORDS
Optical coatings

Scanning electron microscopy

Atomic force microscopy

High power lasers

Solids

Spherical lenses

Chemical analysis

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