Translator Disclaimer
Paper
4 November 1994 Light scattering to characterize both faces of transparent substrates: radiative and embedded light
Author Affiliations +
Proceedings Volume 2253, Optical Interference Coatings; (1994) https://doi.org/10.1117/12.192056
Event: 1994 International Symposium on Optical Interference Coatings, 1994, Grenoble, France
Abstract
An alternative method is presented that allows light scattering technique to characterize both faces of transparent substrates. Experimental results are presented and the limitation of the method is investigated. In addition, a simple formulae is given to approximate the embedded scattering in the substrate, that cannot merge in air. The amount of this embedded scattering cannot be neglected in most cases.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Didier Torricini and Claude Amra "Light scattering to characterize both faces of transparent substrates: radiative and embedded light", Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); https://doi.org/10.1117/12.192056
PROCEEDINGS
14 PAGES


SHARE
Advertisement
Advertisement
Back to Top