Translator Disclaimer
Paper
17 October 1994 Challenges in IR system testing
Author Affiliations +
Abstract
A new generation of test equipment must be developed to meet the calibration needs of evolving infrared imaging systems. New systems can no longer be simply called sensors -- they are sensors with built-in computers. These systems modify images in new ways. As such, the traditional definitions of NEDT, MRT, MTF, and fixed pattern noise are questioned. New metrics may be needed to describe system performance. New performance metrics may also evolve that are less prone to measurements errors.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerald C. Holst "Challenges in IR system testing", Proc. SPIE 2269, Infrared Technology XX, (17 October 1994); https://doi.org/10.1117/12.188677
PROCEEDINGS
9 PAGES


SHARE
Advertisement
Advertisement
Back to Top