Field measurement technique for infrared camera characterization

Alexis P. Tzannes

doi:10.1117/12.188676

17 October 1994 Field measurement technique for infrared camera characterization

Alexis P. Tzannes

Proceedings Volume 2269, Infrared Technology XX; (1994) https://doi.org/10.1117/12.188676
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

This paper is an extension of previous work which dealt with characterizing the performance of staring PtSi infrared cameras, based on estimating their spatial frequency response. Applying a modified knife edge technique, we arrive at an estimate of the edge spread function (ESF), which is used to obtain a profile through the center of the two-dimensional modulation transfer function (MTF). In this paper, we demonstrate that this technique is applicable as a field measurement. The resolution of the system can be calculated using the width of the line spread function (LSF) and an image of an object of known width. In addition, by applying this technique at long range, the MTF of the atmosphere can be measured.

Citation Download Citation

Alexis P. Tzannes "Field measurement technique for infrared camera characterization", Proc. SPIE 2269, Infrared Technology XX, (17 October 1994); https://doi.org/10.1117/12.188676

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available