Polarimetric vector diffraction tomography

Michael Brandfass; Karl J. Langenberg; A. Fritsch

doi:10.1117/12.186710

14 September 1994 Polarimetric vector diffraction tomography

Michael Brandfass, Karl J. Langenberg, A. Fritsch

Proceedings Volume 2275, Advanced Microwave and Millimeter-Wave Detectors; (1994) https://doi.org/10.1117/12.186710
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Scalar linearized inverse scattering has recently found a unified treatment within the framework of diffraction tomography in either frequency or angular diversity. The linear inverse scattering theory can be extended to electromagnetic vector fields to include complete polarization information. Its essential feature is the formulation of a vector Porter-Bojarski integral equation to be inverted by dyadic algebra. Algorithms are discussed for frequency diversity within linearized approximations for perfectly conducting and weak scattering objects, respectively. Particularly, a vector Fourier diffraction slice theorem has been obtained. These algorithms are checked against synthetic data obtained with a FDTD-code (MAFIA) to prove whether they offer advantages over non-polarimetric tomography. Hence, the FDTD-code is utilized to obtain synthetic data for a variety of scattering geometries to demonstrate the performance of vector diffraction tomography.

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Michael Brandfass, Karl J. Langenberg, and A. Fritsch "Polarimetric vector diffraction tomography", Proc. SPIE 2275, Advanced Microwave and Millimeter-Wave Detectors, (14 September 1994); https://doi.org/10.1117/12.186710

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KEYWORDS

Diffraction

Fourier transforms

Scattering

Tomography

Electromagnetic scattering

Electromagnetism

Inverse scattering

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