Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors

George W. Fraser; John Ernest Lees; James F. Pearson; Anthony P. Nichols; P. Bailey

doi:10.1117/12.186803

16 September 1994 Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors

George W. Fraser, John Ernest Lees, James F. Pearson, Anthony P. Nichols, P. Bailey

Proceedings Volume 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V; (1994) https://doi.org/10.1117/12.186803
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

We describe our recent synchrotron measurements of microchannel plate (MCP) quantum detection efficiency made in pulse-counting mode in a 40-300 eV band containing the L shell absorption edges of silicon. The significance of this data for the calibration of the HRC-S transmission grating detector for the AXAF-I X-ray observatory is discussed.

Citation Download Citation

George W. Fraser, John Ernest Lees, James F. Pearson, Anthony P. Nichols, and P. Bailey "Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors", Proc. SPIE 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V, (16 September 1994); https://doi.org/10.1117/12.186803

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