Validity of the perturbation approximation for rough surface scattering from dielectrics and finite conductors

Min-Joon Kim; H. M. Berenyi; Shahram Tajbakhsh; Ronald E. Burge

doi:10.1117/12.197542

21 December 1994 Validity of the perturbation approximation for rough surface scattering from dielectrics and finite conductors

Min-Joon Kim, H. M. Berenyi, Shahram Tajbakhsh, Ronald E. Burge

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Proceedings Volume 2316, SAR Data Processing for Remote Sensing; (1994) https://doi.org/10.1117/12.197542
Event: Satellite Remote Sensing, 1994, Rome, Italy

Abstract

We present a study of the region of validity of the first order small perturbation theory applied to rough surface scattering. A detailed quantitative understanding of the range of such validity was obtained by comparison with numerical simulations for the case of a periodic surface, or gratings, varying in one dimension. Scattering of electromagnetic waves from an ensemble of gratings of sufficiently long period will give a good approximation to the case of an infinite rough surface. The comparison procedure undertaken was focussed on the accuracy of the approximation as a function of rms surface height and the incident angles down to a grazing angle. Results for some examples from a range of material properties, from perfect dielectrics to finite conductors, are shown in this paper. Together with a new heuristic also presented, it is observed that for the case of a pure dielectric the first order small perturbation theory for the horizontal polarization remains valid for all incidence angles, while for the vertical polarization it seems to fail if the incidence angle approaches the Brewster angle.

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Min-Joon Kim, H. M. Berenyi, Shahram Tajbakhsh, and Ronald E. Burge "Validity of the perturbation approximation for rough surface scattering from dielectrics and finite conductors", Proc. SPIE 2316, SAR Data Processing for Remote Sensing, (21 December 1994); https://doi.org/10.1117/12.197542

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KEYWORDS

Polarization

Dielectrics

Scattering

Scanning probe microscopy

Synthetic aperture radar

Data processing

Remote sensing

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