Detection of secondary reflections using morphology

John W. V. Miller; Behrouz N. Shabestari

doi:10.1117/12.188741

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3 October 1994 Detection of secondary reflections using morphology

John W. V. Miller, Behrouz N. Shabestari

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Proceedings Volume 2347, Machine Vision Applications, Architectures, and Systems Integration III; (1994) https://doi.org/10.1117/12.188741
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States

Abstract

This paper discusses very simple but effective one-dimensional morphological techniques for the identification of primary and secondary peak locations associated with reflected light patterns from glass surfaces. A common optical technique for measuring glass thickness and related properties is to observe light reflected from the glass surfaces. Two reflections can be observed when an appropriate structured light source is used to illuminate a glass surface. A very bright primary reflection associated with the reflection from the front surface will be observed along with a much fainter secondary reflection from the back surface. The secondary reflection is difficult to detect reliably given the large difference in magnitude between the two peaks, the presence of noise, and the varying amounts of overlap between the two peaks that can occur. The methods described in the paper have been implemented successfully for two vision applications using images acquired using standard matrix and linear cameras. The signal is preprocessed using one-dimensional morphological and linear methods to normalize the background and remove noise. Further morphological operations are performed to identify the peaks associated with primary and secondary reflections.

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John W. V. Miller and Behrouz N. Shabestari "Detection of secondary reflections using morphology", Proc. SPIE 2347, Machine Vision Applications, Architectures, and Systems Integration III, (3 October 1994); https://doi.org/10.1117/12.188741

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