Three-dimensional contouring by an optical radar system

Heinrich A. Hoefler; Gerhard Schmidtke; Volker Jetter; A. Henninger

doi:10.1117/12.198848

6 January 1994 Three-dimensional contouring by an optical radar system

Heinrich A. Hoefler, Gerhard Schmidtke, Volker Jetter, A. Henninger

Proceedings Volume 2348, Imaging and Illumination for Metrology and Inspection; (1994) https://doi.org/10.1117/12.198848
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States

Abstract

Dimensional measurement techniques are requested to determine distance and length measurement, for two and three dimensional profiling or for volume determination. To meet the requirements of numerous tasks in process monitoring or quality control different measurement principles are available. Out of the 3-D methods, the reported optical radar shows special advantages: * short data acquisition period, * co-axial optics, * high accuracy for the determination of the distance, and * quick and straightforward data evaluation. In this context, a system based on the method of optical radar is described in more detail. The system provides data for three-dimensional scene analysis with the spatial coordinates of a surface to be determined within a pre-defmed volume. A complete 3-D picture with 500 x 500 pixels is recorded and evaluated within less than 2 seconds. The role of speckles limiting the accuracy of the measurement is described in some detail, too.

Citation Download Citation

Heinrich A. Hoefler, Gerhard Schmidtke, Volker Jetter, and A. Henninger "Three-dimensional contouring by an optical radar system", Proc. SPIE 2348, Imaging and Illumination for Metrology and Inspection, (6 January 1994); https://doi.org/10.1117/12.198848

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