Paper
4 January 1995 Laser-induced fluorescence lifetime measurement
Peter T. Waltenberg, Peter J. Hilton
Author Affiliations +
Proceedings Volume 2349, Industrial Optical Sensors for Metrology and Inspection; (1995) https://doi.org/10.1117/12.198682
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States
Abstract
This paper describes a system for directly measuring and imaging fluorescent lifetimes of materials. The system has been prototyped and will be used to improve the detection and discrimination capabilities of our existing scanning systems. The fluorescence lifetimes are determined from the phase difference between a temporally modulated laser excitation source and the resulting fluorescence. Imaging is accomplished by scanning the laser spot across the sample.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter T. Waltenberg and Peter J. Hilton "Laser-induced fluorescence lifetime measurement", Proc. SPIE 2349, Industrial Optical Sensors for Metrology and Inspection, (4 January 1995); https://doi.org/10.1117/12.198682
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KEYWORDS
Luminescence

Modulation

Phase shift keying

Imaging systems

Demodulation

Phase shifts

Digital filtering

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