Paper
6 October 1994 Evaluation of subpixel feature localization methods for precision measurement
Robert J. Valkenburg, Alan M. McIvor, P. Wayne Power
Author Affiliations +
Proceedings Volume 2350, Videometrics III; (1994) https://doi.org/10.1117/12.189135
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States
Abstract
This paper provides a review of a number of subpixel estimators classified as moment based, local modelling and reconstruction. Three algorithms are described in detail, one from each class. In the first, the basic centroid method is generalized so that it is applicable to a wider class of problems and the general formulation is applied to develop a subpixel ridge estimator. The second algorithm is a restricted polynomial model and is developed based on the assumption that an edge profile remains invariant in a local neighborhood. The third algorithm uses Gaussian interpolation to perform local image reconstruction. Simulations are performed to measure the performance of these three algorithms under ideal and noisy conditions.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert J. Valkenburg, Alan M. McIvor, and P. Wayne Power "Evaluation of subpixel feature localization methods for precision measurement", Proc. SPIE 2350, Videometrics III, (6 October 1994); https://doi.org/10.1117/12.189135
Lens.org Logo
CITATIONS
Cited by 16 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Reconstruction algorithms

Algorithm development

Cameras

Precision measurement

Computer simulations

Detection and tracking algorithms

Sensors

Back to Top