Paper
6 October 1994 Whole-field optical profilometry: application of nonlinear processing algorithms to the enhancement of low-contrast images
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Proceedings Volume 2350, Videometrics III; (1994) https://doi.org/10.1117/12.189144
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States
Abstract
A nonlinear filtering technique for the preprocessing of very low contrast images has been applied to optical profilometry, as an attempt to improve the accuracy of the measurement of objects in harsh conditions. The technique is based on the application of a nonlinear architecture composed of linear Laplacian filters followed by quadratic filters which detect correlated elements. The above sequence of operators results in efficient highpass filtering, keeping at the same time the signal-to-noise ratio within acceptable limits. When applied to highly transparent or weakly diffusive surfaces, the preelaboration technique has largely improved the accuracy of the profilometer. In this paper the preelaboration technique is presented. In particular, the influence of the nonlinear image elaboration on the overall system performance is discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Luca Biancardi, Sergio Carrato, Giovanni Ramponi, and Giovanna Sansoni "Whole-field optical profilometry: application of nonlinear processing algorithms to the enhancement of low-contrast images", Proc. SPIE 2350, Videometrics III, (6 October 1994); https://doi.org/10.1117/12.189144
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Cited by 2 scholarly publications.
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KEYWORDS
Nonlinear filtering

Profilometers

Image filtering

Image enhancement

Nonlinear optics

Linear filtering

Silicon

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