AES investigation of anodic film on HCT crystal

Ting-Lian Wen; Zhiyi Lu; Zhihong Xu; Jiaxiong Fang; Yanjin Li

doi:10.1117/12.190776

26 October 1994 AES investigation of anodic film on HCT crystal

Ting-Lian Wen, Zhiyi Lu, Zhihong Xu, Jiaxiong Fang, Yanjin Li

Proceedings Volume 2364, Second International Conference on Thin Film Physics and Applications; (1994) https://doi.org/10.1117/12.190776
Event: Thin Film Physics and Applications: Second International Conference, 1994, Shanghai, China

Abstract

Auger Electron spectrum (AES) study has been carried out on the anodic film which was deposited by electrochemical method on the surface of Hg_1-xCd_xTe (HCT) crystal with x approximately equals 0.21. The element depth profile within the film and at the interface with substrate crystal was analyzed by means of Ar⁺ ions sputtering. The influences of current density, potential and electrolyte concentration during electrochemical deposition on the film structure are manifested.

Citation Download Citation

Ting-Lian Wen, Zhiyi Lu, Zhihong Xu, Jiaxiong Fang, and Yanjin Li "AES investigation of anodic film on HCT crystal", Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); https://doi.org/10.1117/12.190776

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