Translator Disclaimer
Paper
26 October 1994 AES investigation of anodic film on HCT crystal
Author Affiliations +
Proceedings Volume 2364, Second International Conference on Thin Film Physics and Applications; (1994) https://doi.org/10.1117/12.190776
Event: Thin Film Physics and Applications: Second International Conference, 1994, Shanghai, China
Abstract
Auger Electron spectrum (AES) study has been carried out on the anodic film which was deposited by electrochemical method on the surface of Hg1-xCdxTe (HCT) crystal with x approximately equals 0.21. The element depth profile within the film and at the interface with substrate crystal was analyzed by means of Ar+ ions sputtering. The influences of current density, potential and electrolyte concentration during electrochemical deposition on the film structure are manifested.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ting-Lian Wen, Zhiyi Lu, Zhihong Xu, Jiaxiong Fang, and Yanjin Li "AES investigation of anodic film on HCT crystal", Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); https://doi.org/10.1117/12.190776
PROCEEDINGS
5 PAGES


SHARE
Advertisement
Advertisement
Back to Top