Structure quality determination of the Hg1-xCdxTe thin films

Fuju Yu

doi:10.1117/12.190730

26 October 1994 Structure quality determination of the Hg_1-xCd_xTe thin films

Fuju Yu

Proceedings Volume 2364, Second International Conference on Thin Film Physics and Applications; (1994) https://doi.org/10.1117/12.190730
Event: Thin Film Physics and Applications: Second International Conference, 1994, Shanghai, China

Abstract

The study of lattice mismatch strain, composition mutation in Hg_1-xCd_xTe thin films, and intensive strain field which created from substrate and acrossed all epilayers was nondestructively carried out by X-ray double crystal diffraction and X-ray topography.

Citation Download Citation

Fuju Yu "Structure quality determination of the Hg_1-xCd_xTe thin films", Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); https://doi.org/10.1117/12.190730

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