CMOS analog-to-digital conversion for uncooled bolometer infrared detector arrays

Ulf Ringh; Christer Jansson; Kevin Charles Liddiard

doi:10.1117/12.210544

30 May 1995 CMOS analog-to-digital conversion for uncooled bolometer infrared detector arrays

Ulf Ringh, Christer Jansson, Kevin Charles Liddiard

Proceedings Volume 2474, Smart Focal Plane Arrays and Focal Plane Array Testing; (1995) https://doi.org/10.1117/12.210544
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

Bias and signal conditioning techniques for uncooled resistance bolometer infrared detectors employ dc bias or various ac modulation and readout techniques. This paper describes a novel method of converting the absorbed incident radiation into digital signals by use of 0.8 micrometers CMOS oscillators in each pixel. Incoming radiation causes a resistance change in the bolometer which in turn results in a frequency shift. A concept of accurately readout out the digital signals from each pixel in the array is presented. Pixelwise A/D conversion and readout is demonstrated using a thin film semiconductor bolometer detector array. An NETD (Noise Equivalent Temperature Difference) of 0.1 K has been measured.

Citation Download Citation

Ulf Ringh, Christer Jansson, and Kevin Charles Liddiard "CMOS analog-to-digital conversion for uncooled bolometer infrared detector arrays", Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); https://doi.org/10.1117/12.210544

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