Characterization of post-correction uniformity on infrared focal plane arrays

John J. O'Neill III; Christopher R. Costanzo; David R. Kaplan

doi:10.1117/12.210556

30 May 1995 Characterization of post-correction uniformity on infrared focal plane arrays

John J. O'Neill III, Christopher R. Costanzo, David R. Kaplan

Proceedings Volume 2474, Smart Focal Plane Arrays and Focal Plane Array Testing; (1995) https://doi.org/10.1117/12.210556
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

With increased requirements for better performance being placed on thermal imaging systems, new characterization figures of merit are being developed to assess infrared focal plane array (IRFPA) attributes. Post correction uniformity (PCU) is a parameter that determines how successfully a thermal imaging system can eliminate spatial noise from scanning and staring focal plane arrays. Requirements on PCU, particularly for the more sensitive IRFPAs and applications, are quite rigorous. Test issues of l/f noise, drift, and repeatability become critical and require a rethinking of accepted methods. As infrared sensors have become more sensitive, the need to characterize these focal plane arrays under more controlled and realistic test conditions has emerged. The U.S. Army Night Vision and Electronic SEnsors Directorate (NVESD) has attempted to address these issues by developing a unique capability to measure the PCU of IR focal plane arrays using software algorithms and a specialized mechanical modulator. The modulator is a two foot diameter, two toothed (one reflective and one emissive) blade, which is used to facilitate the real-time collection of test, gain, and offset flux levels. This paper addresses (1) the significance of PCU from a system perspective, (2) discuss the limitations of various PCU measurement techniques, (3) present the NVESD approach for measuring PCU, and (4) report PCU data collected using these techniques.

Citation Download Citation

John J. O'Neill III, Christopher R. Costanzo, and David R. Kaplan "Characterization of post-correction uniformity on infrared focal plane arrays", Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); https://doi.org/10.1117/12.210556

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