Continuous-time calibration of VLSI sensors for gain and offset variations

John G. Harris

doi:10.1117/12.210573

30 May 1995 Continuous-time calibration of VLSI sensors for gain and offset variations

John G. Harris

Proceedings Volume 2474, Smart Focal Plane Arrays and Focal Plane Array Testing; (1995) https://doi.org/10.1117/12.210573
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

Parameter variations cause unavoidable nonuniformities in infrared focal plane arrays and other integrated sensors. A one-time calibration procedure is normally used to counteract the effect of these variations between components. Unfortunately, many of these variations fluctuate with time--either with operating point (such as data-dependent variations) or with external conditions (such as temperature). Calibrating these sensors one-time only at the `factory' is not suitable--much more frequent calibration is required. We have developed an adaptive algorithm that continually calibrates an array of sensors that contains gain and offset variations. This paper extends the work of Ullman and Schechtman who developed an algorithm for gain adjustment. The adaptive nonlinear dynamical system can be mapped to analog VLSI or a discretized version may be efficiently implemented in digital hardware.

Citation Download Citation

John G. Harris "Continuous-time calibration of VLSI sensors for gain and offset variations", Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); https://doi.org/10.1117/12.210573

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