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30 May 1995 Test methodologies for linear longwave infrared detector array production
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Abstract
We describe in this paper a flow process that details design, fabrication, and test methodologies for the production of linear longwave infrared (LWIR) HgCdTe (MCT) detector arrays. The modular manufacturing approach emphasizes testability in the component design and zero-loss procedure in the FPA assembly that achieved reliable, low-cost production of high performance scanning LWIR focal plane arrays. In-depth theory, practice, and automation of infrared detector array evaluation are also discussed.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Samuel C. H. Wang, Gregg K. Dudoff, John Roussis, John M. Swab, Michael L. Winn, and Steven R. Jost "Test methodologies for linear longwave infrared detector array production", Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); https://doi.org/10.1117/12.210563
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