Systematic errors in high-precision optical interferometric astrometry

Martin Charles Noecker

doi:10.1117/12.212992

26 June 1995 Systematic errors in high-precision optical interferometric astrometry

Martin Charles Noecker

Proceedings Volume 2477, Spaceborne Interferometry II; (1995) https://doi.org/10.1117/12.212992
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

This paper lists several of the systematic error sources which we have identified in our studies of POINTS, concentrating on those which are expected to affect other spaceborne astrometric interferometers as well. Many of them also are expected to affect ground-based optical interferometers. Among the errors is a newly discovered systematic contribution which only occurs in the simultaneous presence of diffraction, aberration, spectrometer dispersion, and two-beam (Michelson) interference. This error can be as large as several nanometers of optical path difference, and thus may constitute an important source of systematic uncertainty in ground-based astrometric measurements as well.

Citation Download Citation

Martin Charles Noecker "Systematic errors in high-precision optical interferometric astrometry", Proc. SPIE 2477, Spaceborne Interferometry II, (26 June 1995); https://doi.org/10.1117/12.212992

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