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9 October 1995 Low-noise ion source for the implementation of Jet-REMPI: novel on-line monitor for process control
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Proceedings Volume 2504, Environmental Monitoring and Hazardous Waste Site Remediation; (1995)
Event: European Symposium on Optics for Environmental and Public Safety, 1995, Munich, Germany
Modern techniques for on-line process control require versatile monitoring mthods which combine high sensitivity with high selectivity. In this paper a novel REMPI-mass spectrometer is presented. In comparison to standard instruments, sensitivity is increased by shifting the ionization regime to the vicinity of thecontinuum portion ('jet') of the sample beam as opposed to the more conventional ionization under molcular beam conditions. A further gain in sensitivity is achieved by increasing the ionization volume. This was made possibl eby a complete redesign of the ion source. A very low base-line level is achieved by choosing a geometry preventing secondary ionization through thecollisions of ions/electrons with surfaces. These innovations have resulted in excellent performance from our apparatus as demonstrated by the dichorotoluene and naphtalene spectra obtained under various conditions. For naphtalene we have now a detection limit of 5 ppt (more fraction) for S/N equals 1 in 20 sec. Further developments of the technique and research needs ae discussed.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Harald Oser, Reinhold Thanner, and Horst-Henning Grotheer "Low-noise ion source for the implementation of Jet-REMPI: novel on-line monitor for process control", Proc. SPIE 2504, Environmental Monitoring and Hazardous Waste Site Remediation, (9 October 1995);


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