Vertical dispersion methods in x-ray spectroscopy of high-temperature plasmas

Oldrich Renner; Thomas Missalla; Eckhart Foerster

doi:10.1117/12.220976

18 September 1995 Vertical dispersion methods in x-ray spectroscopy of high-temperature plasmas

Oldrich Renner, Thomas Missalla, Eckhart Foerster

Proceedings Volume 2523, Applications of Laser Plasma Radiation II; (1995) https://doi.org/10.1117/12.220976
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

General formulae for the applying the vertical dispersion principle in x-ray spectroscopy of multiply charged ions are summarized, the characteristics of the experimental schemes based on flat and bent crystals are discussed. The unique properties of the novel spectroscopic methods, i.e. their extremely high dispersion, high spectral and 1D spatial resolution, and good collection efficiency, make them very attractive for ultrahigh-resolution spectroscopy. The examples of successful use of the vertical dispersion modifications of the double-crystal and the Johann sepctrometer in diagnostics of several types of laser-generated plasma are presented.

Citation Download Citation

Oldrich Renner, Thomas Missalla, and Eckhart Foerster "Vertical dispersion methods in x-ray spectroscopy of high-temperature plasmas", Proc. SPIE 2523, Applications of Laser Plasma Radiation II, (18 September 1995); https://doi.org/10.1117/12.220976

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