Examining polymeric materials with near-field optics

Ricky L. Williamson; Mervyn J. Miles; K. D. Jandt

doi:10.1117/12.218701

6 September 1995 Examining polymeric materials with near-field optics

Ricky L. Williamson, Mervyn J. Miles, K. D. Jandt

Proceedings Volume 2535, Near-Field Optics; (1995) https://doi.org/10.1117/12.218701
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Scanning near-field optical microscopy has been used to study birefringent banded polymer spherulites. The bands and their sub-structure is seen to correlate directly with the topography verifying established spherulite morphology theories. Block co-polymer examination of a poly(styrene)-poly(2-vinyl pyridine) have revealed sharp contrast for dielectric structures. This contrast is thought to be due to topographic diffraction effects. Ring like structures seen in some of the near-field images are thought to correspond to the accepted structure of this polymer.

Citation Download Citation

Ricky L. Williamson, Mervyn J. Miles, and K. D. Jandt "Examining polymeric materials with near-field optics", Proc. SPIE 2535, Near-Field Optics, (6 September 1995); https://doi.org/10.1117/12.218701

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