Fluorescence scanning near-field optical microscopy in reflection

Alain Jalocha; Marco H. P. Moers; Niko F. van Hulst

doi:10.1117/12.218694

6 September 1995 Fluorescence scanning near-field optical microscopy in reflection

Alain Jalocha, Marco H. P. Moers, Niko F. van Hulst

Proceedings Volume 2535, Near-Field Optics; (1995) https://doi.org/10.1117/12.218694
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

A Fluorescence Scanning Near-Field Optical Microscope operated in reflection is presented. A pulled optical fiber is used both as an emitter for the exciting light and a collector for the generated fluorescence. The advantage of this set-up is the use of the fiber tip as an emitter and a collector. The sample is locally illuminated and no extra optical elements are needed for the detection. We will describe the shear force set-up which is used to control the tip to surface distance. Direct correlation between force map and optical signal is thus possible. Fluorescence images have been obtained on Langmuir-Blodgett films where we estimate the resolution at 200 nm. Moreover the anisotropic property of the monolayer allows polarization contrast measurements. Thus, we show true optical contrast due to fluorescence and polarization is applicable to this configuration. Artifacts in LB films shear force image are discussed. Shear force approach curves obtained on glass and polymer domains are presented to explain the chemical origin of the phenomenon.

Citation Download Citation

Alain Jalocha, Marco H. P. Moers, and Niko F. van Hulst "Fluorescence scanning near-field optical microscopy in reflection", Proc. SPIE 2535, Near-Field Optics, (6 September 1995); https://doi.org/10.1117/12.218694

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