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6 September 1995 Tunnel near-field optical microscopy (TNOM-2)
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Abstract
Light emitted from the aperture of a near-field optical probe in the close vicinity of a dielectric object propagates in classically `forbidden' as well as `allowed' directions; the two zones are separated by the critical angle for total internal reflection. The new `tunnel' near-field optical microscopy (TNOM) technique makes use of forbidden and allowed radiation, in contrast to standard scanning near-field optical microscopy (SNOM or NSOM), which records only the allowed light. Scan images obtained with allowed and forbidden light are complementary to some extent; the latter, however, provide high contrast and resolution even in situations in which standard SNOM/NSOM shows little or no contrast. The influence of topography on image formation is analyzed and discussed.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bert Hecht, Dieter W. Pohl, Harry Heinzelmann, and Lukas Novotny "Tunnel near-field optical microscopy (TNOM-2)", Proc. SPIE 2535, Near-Field Optics, (6 September 1995); https://doi.org/10.1117/12.218689
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