Application of automated grating interferometry to material microstructure studies

Leszek A. Salbut; Grzegorz Dymny; Marcin Ciesielski

doi:10.1117/12.212634

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23 June 1995 Application of automated grating interferometry to material microstructure studies

Leszek A. Salbut, Grzegorz Dymny, Marcin Ciesielski

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Proceedings Volume 2545, Interferometry VII: Applications; (1995) https://doi.org/10.1117/12.212634
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

High-sensitivity, automatic grating interferometry (AGI) system is shown as the effective experimental tool for the material microstructure studies. Two interferometers, laboratory AGI for static and portable AGI for dynamic loading of the specimen are presented. The full methodology of a sample preparation, measurement and data analysis process with special attention paid to combining the information about grain borders and displacement/strain fields distribution is described. The experimental displacement fields obtained at the borders between grains in bicrystal, tricrystal, and polycrystal aluminum alloy are presented. The strain maps of tricrystal sample are presented and discussed.

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Leszek A. Salbut, Grzegorz Dymny, and Marcin Ciesielski "Application of automated grating interferometry to material microstructure studies", Proc. SPIE 2545, Interferometry VII: Applications, (23 June 1995); https://doi.org/10.1117/12.212634

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