You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
13 October 1995Far-infrared response of high-purity GaAs photoconductors
In this paper we report the results of an extensive study on the far-infrared photoconductivity of high purity n-type GaAs. The crystal, which was grown at Max Plank Institute using liquid- phase epitaxy, exhibited the fine structures of the excited state transitions of the residual shallow level impurities. The major peak in the spectral response belongs to the 1s-2p transition, with its responsivity about thirty five times higher than the continuum. At 3.4K detector temperature, 625 mV bias, and 100 Hz chopping frequency the detector responsivity at 35.4 cm-1 (279 micrometers ) was measured to be 0.017 A/W. Under these same conditions, the NEP was 5.9 X 10-14 W/(root)Hz. The dark current at 25 mV bias was 5.6 X 10-14 A.
The alert did not successfully save. Please try again later.
Jam Farhoomand, Robert E. McMurray Jr., Eugene E. Haller, Elisabeth Bauser, I. Silier, "Far-infrared response of high-purity GaAs photoconductors," Proc. SPIE 2558, Millimeter and Submillimeter Waves II, (13 October 1995); https://doi.org/10.1117/12.224215