Models of superconducting microstrip and coplanar elements for submillimeter applications

Pascal Febvre; Corinne Boutez; Sebastien George; Gerard Beaudin

doi:10.1117/12.224218

13 October 1995 Models of superconducting microstrip and coplanar elements for submillimeter applications

Pascal Febvre, Corinne Boutez, Sebastien George, Gerard Beaudin

Proceedings Volume 2558, Millimeter and Submillimeter Waves II; (1995) https://doi.org/10.1117/12.224218
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Some models which predict the microwave properties of superconducting microstrip lines, radial stubs, coplanar lines and coplanar waveguides are presented. These models take into account the dispersion which occurs in superconducting lines when the frequency of operation becomes close to the gap frequency of the superconductros (700 GHz for niobium). The effects of fringing fields are also taken into consideration. These models are also valid for high-temperature superconductors. They have been developed in the specific case of elements for which the characteristic dimension (the dielectric thickness for microstrip lines, the spacing between conductors for coplanar elements) is of the same order of magnitude as the typical length of penetration of the magnetic field in the metal. The length of penetration is the skin depth for normal metals and the London penetration depth for superconductors. The consequence of this particular topology is that the propagation of signals in such a transmission line is slow-wave and its microwave properties are modified. These models are also valid for classical line configurations (dielectric thickness much higher than penetration length).

Citation Download Citation

Pascal Febvre, Corinne Boutez, Sebastien George, and Gerard Beaudin "Models of superconducting microstrip and coplanar elements for submillimeter applications", Proc. SPIE 2558, Millimeter and Submillimeter Waves II, (13 October 1995); https://doi.org/10.1117/12.224218

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