Precise measurements of refractive index distribution and optical surfaces

Tadashi Morokuma

doi:10.1117/12.215584

2 August 1995 Precise measurements of refractive index distribution and optical surfaces

Tadashi Morokuma

Proceedings Volume 2576, International Conference on Optical Fabrication and Testing; (1995) https://doi.org/10.1117/12.215584
Event: International Conferences on Optical Fabrication and Testing and Applications of Optical Holography, 1995, Tokyo, Japan

Abstract

Described are the two frontier areas of interest, that is, the measurement of refractive index distribution in gradient index glasses and the precise evaluation and measurement of optical surfaces for high precision optics. Scanning total reflection method and interferometric methods are applied to the refractive index measurement with an accuracy of 10^-4 to 10^-5. An AFM is found very useful for the evaluation of non-conductive surfaces as well as multilayers for x-ray optics. Methods for absolute measurement of surface profiles are proposed in consideration of the deformation due to gravity and another method for large surfaces.

Citation Download Citation

Tadashi Morokuma "Precise measurements of refractive index distribution and optical surfaces", Proc. SPIE 2576, International Conference on Optical Fabrication and Testing, (2 August 1995); https://doi.org/10.1117/12.215584

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